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| THURSDAY, June 10, 2004, 4:30 PM - 6:00 PM | Room: 6D | ||
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TOPIC AREA: LOGIC DESIGN AND TEST | ||
| SESSION 54 | |||
| New Scan-Based Test Techniques | |||
| Chair: Bernd Koenemann - Cadence Design Systems, Inc., San Jose, CA | |||
| Organizers: Erik Jan Marinissen, Seiji Kajihara | |||
| All papers in this session give new solutions on scan-based testing.
The first paper considers generating tests for scan circuits that ensure that the test only uses funtionally reachable states. This is done in order to avoid reducing yield caused by tests that operate the circuits in non-functional mode. The other two papers describe new architectures for scan-based BIST which will target flexible features and simple implementation, respectively. The last paper presents a test compression method for multiple scan design. | |||
 54.1 |
On the Generation of Scan-Based Test Sets with Reachable States for Testing under Functional Operation Conditions |
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| Speaker(s): | Irith Pomeranz - Purdue Univ., West Lafayette, IN | ||
| Author(s): | Irith Pomeranz - Purdue Univ., West Lafayette, IN | ||
| 54.2 | Scalable Selector Architecture for X-Tolerant Deterministic BIST | ||
| Speaker(s): | Peter Wohl - Synopsys, Inc., Williston, VT | ||
| Author(s): | Peter Wohl - Synopsys, Inc., Williston, VT John A. Waicukauski - Synopsys, Inc., Tualatin, OR Sanjay Patel - Synopsys, Inc., Beaverton, OR | ||
| 54.3s | Scan-BIST Based on Transition Probabilities | ||
| Speaker(s): | Irith Pomeranz - Purdue Univ., West Lafayette, IN | ||
| Author(s): | Irith Pomeranz - Purdue Univ., West Lafayette, IN | ||
| 54.4s | Combining Dictionary Coding and LFSR Reseeding for Test Data Compression | ||
| Speaker(s): | Xiaoyun Sun - Univ. of Minnesota, Minneapolis, MN | ||
| Author(s): | Xiaoyun Sun - Univ. of Minnesota, Minneapolis, MN Larry Kinney - Univ. of Minnesota, Minneapolis, MN Bapiraju Vinnakota - Univ. of Minnesota, Minneapolis, MN | ||
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